Failure prediction of ultra capacitor stack using fuzzy inference system
Keywords:ultracapacitor stack, failure modes, failure prediction, fuzzy inference
AbstractThe failure of the ultracapacitor was signi?cantly accelerated by elevated temperature or increased voltage. Because of the capacitance difference between the capacitor cells, after a number of deep charging/discharging cycles, the voltage difference between cells will be enlarged. This will accelerate the aging of the weak ultracapacitors and affect the output power. So, to improve stack reliability, a correct and timely failure prediction is essential. Based on diverse faults, a fuzzy rule-based inference system, which could approximate human reasoning, was considered. With this method we can reduce uncertainty, inconvenience and inefficiency resulting from the inherent factors. The simulate results under industrial application conditions are given to verify the method.
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