Storage degradation mechanism analysis and storage life prediction of the optoelectronic couplers
Keywords:storage degradation mechanism, optoelectronic coupler, multi-channel degradation
AbstractOptoelectronic couplers are typical optoelectronic devices with long life and high reliability. Accelerated degradation testing is mostly utilized to assess optoelectronic coupler storage life. However, in engineering, integrated optoelectronic coupler may be nagged with the fusion of multi-channel degradation data. To solve this problem, the paper firstly conducted accelerated storage degradation testing on a certain type of the optoelectronic coupler, and analyzes the main degradation model and mechanism of an optoelectronic coupler under storage environment. Meanwhile, the paper gives an access for processing multi-channel degradation data based on pseudo life, which can be also employed to assess other integrated devices, like memories, with their accelerated degradation data.
Copyright 2011 by Faculty of Engineering University of Rijeka, Faculty of Civil Engineering University of Rijeka. All rights reserved. This material may not be reproduced or copied, in whole or in part, in any printed, mechanical, electronic, film, or other distribution and storage media without the written consent of the publisher.
The journal Engineering Review’s publishing procedure is performed in accordance with the publishing ethics statements, defined within the Publishing Ethics Resource Kit. The Ethics statement is available in the document Ethics Policies.