Multi-mode microscopy using diffractive optical elements

Authors

  • Yan Feng
  • Louisa Scholz
  • David Lee
  • Heather Dalgarno
  • David Foo
  • Lei Yang
  • Weiping Lu
  • Alan Greenaway

Abstract

This paper discusses a range of phase-diversity and tracking applications that have been demonstrated experimentally, and will present an analysis of experimental errors associated with the system used. Simultaneous imaging in multiple imaging modes is demonstrated and the use of wavefront-sensing techniques to achieve nanometric depth resolution is reviewed.

Author Biographies

Yan Feng

Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom

Louisa Scholz

Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom

David Lee

UK Astronomy Technology Centre, Edinburgh, United Kingdom

Heather Dalgarno

Dept of Physics and Astronomy, St Andrews University, North Haugh, Fife, United Kingdom

David Foo

Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom

Lei Yang

Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom

Weiping Lu

Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom

Alan Greenaway

Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom

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Published

2011-12-15

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Section

Articles